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futureC integration software for on-wafer test
futureC is a unified hardware communication and testing platform independently developed by Eoulu
and it is also an operating system for on-wafer test and measurement

futureC can easily integrate all the programmable devices. futureC uses advanced test virtual machine (TVM) technology to enhance
the test stability by fewer real-time running assemblies. futureC can easily integrate all the programmable-controlled devices

Moreover, Eoulu for the first time proposed the concept of the enhanced operating system of the on-wafer testing industry,
provides an easy-to-use and powerful tool for the wafer testing

futureC supports SECS / GEM standards, makes probe testing simple in factory automation, and seamlessly connects with futureD big data systems
Appendix 1 lists the common instrument libraries; Appendix 2 lists the recommended combinations of common test applications

futureC - upgraded version for EUCP, is a 100% knowledge product of Eoulu
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Product features
Product architecture
Product parameters
Attachment download
futureC can help you for all this
Upgraded version for EUCP
Integrating all kinds of programmable testing equipment fast, and Mapping fast

Platform is separated from application and instrument, modular maintenance by professional software team,
reduce the dependence of the measurement on engineers

High-precision and high-speed test


The measured values are reliable. It can automatically integrate raw data, parameter extracted and files,

and support seamlessly uploading to futureD database


Integrating all kinds of programmable testing equipment fast, and Mapping fast
Instrument change or application change, the test software does not need to be rewritten
High-precision and
high-speed test
Strong customer base, rich library of measurement methods
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       Equipment communication

       Device driver is separated from the test platform,

           and rich equipment drive library

           and modularization drive rapid development

       


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       MapEditor editor

       Users have a more intuitive experience based

          on traditional wafer map editing

       User-defined Sub Die map

       Accurately map the DUT actual location

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       Wafer testing system

       It supports automated wafer testing

       It supports custom location testing

       It supports rich color gradation plots of test results



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       Offline data grading

       Based on the test data and the wafer map,

           the user can redefine the data grading conditions

       Then, the hierarchical information will be redefined,

           and the data will cover the original wafer map

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      Multiple test modes

      It supports the selective retest of the test results

      It supports breakpoint continuation test

      Select the specified location for testing

      Testing alarm and alarming



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       SECS / GEM protocol components

           Seamlessly connection with futureD (web Big

           Data Management Platform)

            SEMI E5-0600 (SECS-II) standard

            SEMI E30 (GEM) standard

            SEMI E37 (HSMS) standard

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       Grading of test results

       Users can customize the grading criteria

           Set conditions for acceptance/rejection of test results

           Maximum support of 4,096 grades and color gradation

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       Multi-measurement mode

       Single point testing and measuring

       Repeat testing and measuring at a single location

       Chip measuring and whole wafer measuring supported

         The waveform of the 2D curve, the 3D curve,

           and the oscilloscope curve will be shown during testing

           After testing, the statistical analysis can be viewed,

           such as yield rate, and the bar chart of Bin values

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       Set the test menu

           Automatically list the input and output parameters of integrated

           devices and applications

           The user can customize the test process as a test menu

           Import / export test menu



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       The measured values are reliable

           File data formatting and saving

           Users can customize to test result output items and sequence

           Drag function makes the operation convenient and fast

Integrating system fast
Start testing quickly
Mapping and measurement control
Factory automated
futureC installation environment
Typical speed value of futureC test system
Operating environment
No special requirements for the environment


Note: futureC supports real-time data saving and breakpoint continuation testing to avoid data loss caused by accidents

Test speed is related to the configuration and running status of the test PC, the following typical value running resource is Win10 64bit, CPU I7-9,16G memory

Minimum configuration requirements of the PC
Operating systemWin XP/Win7/Win10Win XP/Win7/Win10
ProcessorIntel Core i3 quad-core
Graphics cardIndependent graphics card: 1G
Internal storage8 GB of running memory
Hard disk>125GHz
BrowserUninvolved
Resolution of display1366×768
File reading and writing0.003s / 1000 lines
Instrument IO85ms / times
2Port-S parameter (201 points, IFBW=10KHz)200ms / DUT
DC scan (K2400, AutoRange)3.9s / 50 point
Appendix 1: Examples of common drivers

Equipment manufacturer

Category of programmable devices

Equipment model

Keysight (former Agilent)

DC Power Supply

Agilent E3631 Series

Agilent 6625A, 6626A,6628A, and 6629A

Agilent N6700 Series

DC Source Meter

HP 4142B

Dynamic Signal Analyzer

Agilent 35670

ENA

Agilent E5071 Series

Agilent E8362 Series

Agilent E8363 Series

LCR Meter

Agilent LCR E49XX Series

Agilent LCR 4284A

Lightwave Component Analyzer

Agilent N4373

Multimeter

Agilent 34410

Agilent 34411

Agilent 3458A

Agilent 34401

Oscilloscope

Agilent 86100 Series

Agilent 54830 Infiniium Series

Agilent InfiniiVision 6000 Series

PNA-X

Agilent PNA-X Series

Semiconductor Parameter Analyzer

Agilent 4156 Series

Agilent B1500 Series

Agilent B1505 Series

DAQ/Switch

Agilent 34972A

Agilent B2201A

Agilent 5250A

HP 4085M

Pulse/Data Generator

Agilent 81110A

Agilent 81104A

Function / Arbitrary Waveform Generator

Agilent 33500 & 33600 Series Waveform Generators

NFA Series

Agilent N897xA

Agilent X-Series Signal Analyzer

PXA Signal Analyzer N9030A

MXA Signal Analyzer N9020A

EXA Signal Analyzer N9010A

CXA Signal Analyzer N9000A

NI

Function / Arbitrary Waveform Generator

NI 5402

DAQ/Switch

NI 6501

NI 6221

TEK

Semiconductor Parameter Analyzer

Keithley 4200A-SCS

DC Source Meter

Keithley 2400 Series

Keithley 2500 Series

Keithley 2600 Series

DAQ/Switch

Keithley 2700 Series

Keithley 7001

Keithley 700 Series

Electrometer

Keithley 6517 Series

Function / Arbitrary Waveform Generator

TEK AFG 1000

TEK AFG 2000

TEK AFG 3000

TEK AWG 4000

Oscilloscope

TEK MDO 3000 Series

TEK MDO 4000 Series

R&S

VNA

ZVA Series

Signal and Spectrum Analyzer

RSFSW Series

Anritsu

VNA

MS462XX Series

AU37XX Series

SRS

Lock-In Amplifier

SR830,SR810

YOKOGAWA

Optical Spectrum Analyzer

AQ6370C/AQ6370D/AQ6373/

AQ6373B/AQ6375/AQ6375B

Instrument Systems

Spectrometer

CAS 120

CAS 140CT

Maury

Tuner

Maury Automated Tuner Series

Cascade

Prober Station

Cascade Manual Probe Station Full Series

Cascade Semi-auto Probe Station Full Series

Cascade Full-auto Probe Station Full Series

Cascade High Power Probe Station Full Series

Newport

Monochromator

Oriel Cornerstone 260

Positioning Stages

Nano PZ M562

Auriga

Pulse IV System

Auriga 4850

EOULU

Plug-in

Matlab Controller

Third Party COM Object or System

Iwatsu

High Power Static Tester

CT3200

CT10400

STESLA

High Power Static Tester

Full Series

DTESLA

High Power Dynamic Tester

Full Series

ASTEK

DC Power Supply

IT6100   Series

IT6874

IT8500


Appendix 2: Rapid selection for test application drive

Application selectionRecommended instrument combinationLibrary of test project

DC/CV

Keysight B1500A
-B1511B HRSMU measuring range 200 V / 1 A /, resolution 1fA
-B1511A MPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
-B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
-B1514A MCSMU pulse range 30 V / 1 A (0.1 A DC) minimum pulse width 50 μs, resolution 2 μs
-B1520A MFCMU frequency range 1 kHz~5 MHz, resolution 1 mHz
-SCUU
-GNDU

Keysight B2201A
-B2211A ×4   12ch low leakage switch module

Vth/Gm/Vknee/Vclamp/Rds/Idsat/Idlin...
ID-VD
ID-VG
CurveFit
BV(BVCEO/BVCBO/BVGSS/BVDSS)
β
CV Sweep
Cp-D
Pulse IV

RF

Keysight B1500A
- B1511B HRSMU measuring range 200 V / 1 A /, resolution 1fA
- B1511A MPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
- B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
- B1514A MCSMU pulse range 30 V / 1 A (0.1 A DC)50 μs minimum pulse width, resolution 2 μs
- B1520A MFCMU frequency range 1 kHz~5 MHz, resolution 1 mHz
- SCUU
- GNDU
Keysight N5227B PNA
- Bias Module/Bias Tee
Wincal
Kohzu Positioner
- CURX

S1P
S2P
S3P
S4P
S2P test under bias voltage
TraceFetch
P1dB
P3dB
Power sweeping
Third-order intercept
Noise Figure noise factor
Automatic calibration
Phase scanning

Si-Photoelectric

Keysight LCA N4375E
Keysight B2902A Power supply meter
Keysight N7747A Optical power meter
Keysight N7786B Polarimeter
Keysight 8164B Tunable optical generator
- 81608A
Glsun SUN-FSW-1X8 Photoswitch
PI E-712/ PI Hex-Nano

Auto-coupling
Beat measuring
Power sweeping
Wavelength scanning
Photoelectric S parameter testing
OE-Photoresponse test
OE-Wavelength scanning and photocurrent testing
OE-Luminous power sweeping and photocurrent testing
IL
PDL
FiberArray

Eye Diagram

Keysight 11713A Attenuator
Keysight 34401A Digital multimeter
Keysight E3631A Power
Keysight 86100A Eye analyzer, bandwidth exceeding 50 GHz, time-domain reflectometer/time-domain transport (TDR/TDT)
Anritsu MP1800A BERT
-MP1800A-001 GPIB
-MU181000B 12.5 GHz 4port Synthesizer
-MU183040B 28G/32G bit/s High Sensitivity ED
-MU195040A 21G/32G bit/s SI ED

Thd (total harmonic distortion)
Eye Amplitude
EyeCrossing
EyeSNR
EyeJitterPP
EyeJitterRMS
EyeFallTime
EyeRiseTime

Solder Ball

Keysight B1500A
-B1511B HRSMU measuring range 200 V / 1 A /, resolution 1fA
-B1511A MPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
-B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
-B1514A MCSMU pulse range 30 V / 1 A(0.1 A DC), minimum pulse width 50 μs, resolution 2 μs
-GNDU
Keysight3458A

Ileakage
Rs/Rc

MEMS

Keithley 2400
Keysight 5250A Low leakage switch matrix
-E5252A ×4 pcs 12channel Output   Matrix Switch   
Keysight LCRE4980
Keysight 34410A
Keysight 35670
Keysight E3631A
NI PCI-6221

Qvalue
Risolation
Rdson
CV
Bandwith

Reliability Test

Keysight B1500A
- B1511B HRSMU measuring range 200 V / 1 A /, resolution 1fA
- B1511A MPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
- B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
- B1514A MCSMU pulse range 30 V / 1 A(0.1 A DC)minimum pulse width 50 μs, resolution 2 μs
- B1530A WGFMU×2 DC output and arbitrary waveform generated, programming resolution 10 ns, high speed voltage/current measurement (200 MSa/s, sampling frequency 5ns)
- GNDU
Keysight B2201A
-B2211A ×4   12ch low leakage switch module

TDDB
HCI
NBTI
Fast-NBTI
EM
Ramp
LifeTime

High Power Test

Keysight B1505A
-B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA
-B1512A HCSMU 20A/20 V (pulse);1 A/40 V (DC)
-B1513C HVSMU 1500 V/8 mA; 3000 V/4 mA (pulse and DC)
-B1520A MFCMU frequency range 1 kHz~5 MHz, resolution1 mHz
-GNDU
-N1265A

PowerVoltageOn
PowerCurrentOn
Measure I
Measure V
Vth/Idmax/Rdson
BV(BVCEO/BVCBO/BVGSS/BVDSS)
IdVg
IdVd
CV Sweep
Pulse Seep


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